Miller, Scott M. and Troian, Sandra M. and Wagner, Sigurd (2003) Photoresist-free printing of amorphous silicon thin-film transistors. Applied Physics Letters, 83 (15). pp. 3207-3209. ISSN 0003-6951 http://resolver.caltech.edu/CaltechAUTHORS:MILapl03
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Conventional fabrication of amorphous silicon thin-film transistors (a-Si TFTs) requires patterning numerous photoresist layers, a subtractive process that is time consuming and expensive. This letter describes transistor fabrication by a photoresist-free approach in which polymer etch masks are letterpress printed from flexible polyimide stamps. Pattern registration is achieved through optical alignment since the printed masks are thin and optically transparent. This modified fabrication scheme produces transistor performance equivalent to conventionally fabricated a-Si TFTs. The ability to directly print etch masks onto nonhomogeneous substrates brings one step closer the realization of flexible, large-area, macroelectronic fabrication.
|Additional Information:||©2003 American Institute of Physics. (Received 26 June 2003; accepted 16 August 2003) The authors gratefully acknowledge support from the DARPA Molecular Level Printing Program, the New Jersey Commission on Science and Technology, the US Army TACOM-ARDEC, and the Eastman Kodak Corporation through a graduate fellowship for one of the authors (S.M.M.).|
|Subject Keywords:||silicon; elemental semiconductors; amorphous semiconductors; thin film transistors; printing; masks|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Archive Administrator|
|Deposited On:||18 Sep 2006|
|Last Modified:||26 Dec 2012 09:03|
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