Joergen Garnaes (Jørgen Garnæs) is the Danish
Institue of Fundamental Metrology's (DFM) specialist on scanning
probe microscopy. He studied physics and mathematics at Copenhagen
University, and received a PhD in 1991 from the Laboratory of Applied
Physics at the Danish Technical University for a thesis on scanning
probe microscopy. From 1992 he has been employed at the DFM. Since
1993 he has been involved in collaborations between national European
metrological institutes, and since 1996 he has been a coordinator
of the EU
network on the calibration and metrological use of scanning probe
On the right, Joergen Garnaes explains the workings of a Nanoscope
Joergen Garnaes was one of the first in Denmark to build his own STM.
He has collaborated with the Aarhus
STM group, and has spent a year in Paul
Hansma's lab in Santa Barbara, California.
This page was written by Arne
Hessenbruch and updated on 27 June 2001.