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Thin-film power-density meter for millimeter wavelengths

Lee, Karen A. and Guo, Yong and Stimson, Philip A. and Potter, Kent A. and Chiao, Jung-Chih and Rutledge, David B. (1991) Thin-film power-density meter for millimeter wavelengths. IEEE Transactions on Antennas and Propagation, 39 (3). pp. 425-428. ISSN 0018-926X. http://resolver.caltech.edu/CaltechAUTHORS:LEEieeetap91

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Abstract

A quasi-optical power density meter for millimeter and submillimeter wavelengths has been developed. The device is a 2-cm^2 thin-film bismuth bolometer deposited on a mylar membrane. The resistance responsivity is 150 Ω/W, and the time constant is 1 min. The meter is calibrated at DC. The bolometer is much thinner than a wavelength, and can thus be modeled as a lumped resistance in a transmission-line equivalent circuit. The absorption coefficient is 0.5 for 189-Ω/square film. The power-density meter has been used to measure absolute power densities for millimeter-wave antenna efficiency measurements. Absolute power densities of 0.5 mW/cm^2 have been measured to an estimated accuracy of 5%.


Item Type:Article
Additional Information:© Copyright 1991 IEEE. Reprinted with permission. Manuscript received May 10, 1990; revised September 20, 1990. This work was supported by the Jet Propulsion Laboratory, the Aerojet Electrosystems and the Department of Defense Terahertz Technology Program, under Contract F19628-87-K-0051, which is managed by the Electromagnetics Directorate of RADC and funded by SSIO-IST.
Record Number:CaltechAUTHORS:LEEieeetap91
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:LEEieeetap91
Alternative URL:http://dx.doi.org/10.1109/8.76347
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:6717
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:19 Dec 2006
Last Modified:26 Dec 2012 09:24

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