Roukes, M. L. and Freeman, M. R. and Germain, R. S. and Richardson, R. C. and Ketchen, M. B. (1985) Hot electrons and energy transport in metals at millikelvin temperatures. Physical Review Letters, 55 (4). pp. 422-425. ISSN 0031-9007. http://resolver.caltech.edu/CaltechAUTHORS:ROUprl85
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Using a new technique, we measure the energy-loss lifetime for electrons in a metal from 25 to 320 mK. Applying a small electric field, of order 1 μV/cm at 25 mK, causes carriers to heat above the temperature of the phonon bath. The temperature difference induced reflects the rate of energy transport between the electrons and lattice. The 1-ms energy-loss lifetime and 1-cm inelastic diffusion length we have measured at 25 mK are the largest ever obtained.
|Additional Information:||©1985 The American Physical Society Received 26 April 1985 We owe thanks to many of, or formerly of, Laboratory of Atomic and Solid State Physics at Cornell University; unfortunately, all cannot be mentioned here. We especially thank M.R. Arai, J.W. Wilkins, R.A. Buhrman, P.L. Gammel, D.G. Wildes, and D.F. McQueeney. The dc SQUIDS were fabricated at IBM Thomas J. Watson Research Center, Yorktown Heights, N.Y., by J. Greiner and co-workers. We fabricated the resistors at the National Research and Resource Facility for Submicron Structures, Cornell University. We are grateful to the Semiconductor Research Corporation, U.S. Office of Naval Research, Natural Sciences and Engineering Research Council (Canada), National Science Foundation (DMR-81 19847), and the Materials Science Center (DMR-8217227A-01) for support.|
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|Deposited On:||02 Jan 2007|
|Last Modified:||18 Sep 2014 18:11|
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