Giuliano, C. R. and Marburger, J. H. and Yariv, A. (1972) Enhancement of self-focusing threshold in sapphire with elliptical beams. Applied Physics Letters, 21 (2). pp. 58-60. ISSN 0003-6951 http://resolver.caltech.edu/CaltechAUTHORS:GIUapl72
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The power threshold for optically induced bulk damage in sapphire is a sensitive function of the ellipticity of the incident beam shape. Experimental results are consistent with a simple self-focusing theory.
|Additional Information:||©1972 The American Institute of Physics. Received 30 March 1972. The authors are grateful to V. Evtuhov for helpful discussions and for providing English translations of Ref. 2 and 3. Work supported in part by the Advanced Research Projects Agency under ARPA Order No. 1434 with Air Force Cambridge Research Laboratories.|
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|Deposited By:||Tony Diaz|
|Deposited On:||08 Jan 2007|
|Last Modified:||26 Dec 2012 09:28|
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