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Enhancement of self-focusing threshold in sapphire with elliptical beams

Giuliano, C. R. and Marburger, J. H. and Yariv, A. (1972) Enhancement of self-focusing threshold in sapphire with elliptical beams. Applied Physics Letters, 21 (2). pp. 58-60. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:GIUapl72

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Abstract

The power threshold for optically induced bulk damage in sapphire is a sensitive function of the ellipticity of the incident beam shape. Experimental results are consistent with a simple self-focusing theory.


Item Type:Article
Additional Information:©1972 The American Institute of Physics. Received 30 March 1972. The authors are grateful to V. Evtuhov for helpful discussions and for providing English translations of Ref. 2 and 3. Work supported in part by the Advanced Research Projects Agency under ARPA Order No. 1434 with Air Force Cambridge Research Laboratories.
Record Number:CaltechAUTHORS:GIUapl72
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:GIUapl72
Alternative URL:http://dx.doi.org/10.1063/1.1654278
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:7076
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:08 Jan 2007
Last Modified:26 Dec 2012 09:28

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