Gay, G. and Alloschery, O. and Weiner, J. and Lezec, H. J. and O'Dwyer, C. and Sukharev, M. and Seideman, T. (2007) Surface quality and surface waves on subwavelength-structured silver films. Physical Review E, 75 (1). Art. No. 016612. ISSN 1539-3755 http://resolver.caltech.edu/CaltechAUTHORS:GAYpre07
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Abstract
We analyze the physical-chemical surface properties of single-slit, single-groove subwavelength-structured silver films with high-resolution transmission electron microscopy and calculate exact solutions to Maxwell's equations corresponding to recent far-field interferometry experiments using these structures. Contrary to a recent suggestion the surface analysis shows that the silver films are free of detectable contaminants. The finite-difference time-domain calculations, in excellent agreement with experiment, show a rapid fringe amplitude decrease in the near zone (slit-groove distance out to 3–4 wavelengths). Extrapolation to slit-groove distances beyond the near zone shows that the surface wave evolves to the expected bound surface plasmon polariton (SPP). Fourier analysis of these results indicates the presence of a distribution of transient, evanescent modes around the SPP that dephase and dissipate as the surface wave evolves from the near to the far zone.
| Item Type: | Article |
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| Additional Information: | ©2007 The American Physical Society. (Received 25 August 2006; published 24 January 2007) Support from the Ministère délégué à l’Enseignement supérieur et à la Recherche under the programme ACI “Nanosciences-Nanotechnologies,” the Région Midi-Pyrénées (Grant No. SFC/CR 02/22), and FASTNet (Grant No. HPRN-CT-2002-00304) EU Research Training Network, is gratefully acknowledged, as is support from the Caltech Kavli Nanoscience Institute, the AFOSR under Plasmon MURI Grant No. FA9550-04-1-0434, the National Energy Research Scientific Computing Center, the U.S. Department of Energy under Contract No. DE-AC03-76SF00098, and the San Diego Supercomputer Center under Grant No. PHY050001. Discussions with P. Lalanne, M. Mansuripur, and H. Atwater and computational assistance from Y. Xie are also gratefully acknowledged. |
| Subject Keywords: | silver; metallic thin films; transmission electron microscopy; finite difference time-domain analysis; polaritons; Fourier analysis |
| Record Number: | CaltechAUTHORS:GAYpre07 |
| Persistent URL: | http://resolver.caltech.edu/CaltechAUTHORS:GAYpre07 |
| Alternative URL: | http://dx.doi.org/10.1103/PhysRevE.75.016612 |
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. |
| ID Code: | 7312 |
| Collection: | CaltechAUTHORS |
| Deposited By: | Archive Administrator |
| Deposited On: | 29 Jan 2007 |
| Last Modified: | 26 Dec 2012 09:30 |
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