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Charge transport through DNA four-way junctions

Odom, Duncan T. and Dill, Erik A. and Barton, Jacqueline K. (2001) Charge transport through DNA four-way junctions. Nucleic Acids Research, 29 (10). pp. 2026-2033. ISSN 0305-1048. http://resolver.caltech.edu/CaltechAUTHORS:ODOnar01

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Abstract

Long range oxidative damage as a result of charge transport is shown to occur through single crossover junctions assembled from four semi-complementary strands of DNA. When a rhodium complex is tethered to one of the arms of the four-way junction assembly, thereby restricting its intercalation into the {pi}-stack, photo-induced oxidative damage occurs to varying degrees at all guanine doublets in the assembly, though direct strand scission only occurs at the predicted site of intercalation. In studies where the Mg2+ concentration was varied, so as to perturb base stacking at the junction, charge transport was found to be enhanced but not to be strongly localized to the arms that preferentially stack on each other. These data suggest that the conformations of four-way junctions can be relatively mobile. Certainly, in four-way junctions charge transport is less discriminate than in the more rigidly stacked DNA double crossover assemblies.


Item Type:Article
Additional Information:© 2001 Oxford University Press Received February 13, 2001; Revised and Accepted March 21, 2001. We are grateful to the NIH (GM49216) for financial support. We also thank the Parsons Foundation for pre-doctoral support of D.T.O. and the Caltech SURF office for a summer fellowship to E.A.D.
Record Number:CaltechAUTHORS:ODOnar01
Persistent URL:http://resolver.caltech.edu/CaltechAUTHORS:ODOnar01
Alternative URL:http://dx.doi.org/0.1093/nar/29.10.2026
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:816
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:08 Oct 2005
Last Modified:26 Dec 2012 08:41

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