Kumar, Shwetank and Gao, Jiansong and Zmuidzinas, Jonas and Mazin, Benjamin A. and LeDuc, Henry G. and Day, Peter K. (2008) Temperature dependence of the frequency and noise of superconducting coplanar waveguide resonators. Applied Physics Letters, 92 (12). Art. No. 123503. ISSN 0003-6951 http://resolver.caltech.edu/CaltechAUTHORS:KUMapl08
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We present measurements of the temperature and power dependence of the resonance frequency and frequency noise of superconducting niobium thin-film coplanar waveguide resonators carried out at temperatures well below the superconducting transition (Tc=9.2 K). The noise decreases by nearly two orders of magnitude as the temperature is increased from 120 to 1200 mK, while the variation of the resonance frequency with temperature over this range agrees well with the standard two-level system (TLS) model for amorphous dielectrics. These results support the hypothesis that TLSs are responsible for the noise in superconducting microresonators and have important implications for resonator applications such as qubits and photon detectors.
|Additional Information:||©2008 American Institute of Physics. Received 27 November 2007; accepted 19 February 2008; published 25 March 2008. We thank Sunil Golwala, Kent Irwin, Andrew Lange, Konrad Lehnert, Harvey Moseley, and especially John Martinis for useful discussions. This work was supported in part by the NASA Science Mission Directorate, JPL, and the Gordon and Betty Moore Foundation.|
|Subject Keywords:||coplanar waveguide components, micromechanical resonators, niobium, superconducting device noise, superconducting resonators, superconducting thin films, superconducting transition temperature, thin film devices|
|Usage Policy:||No commercial reproduction, distribution, display or performance rights in this work are provided.|
|Deposited By:||Archive Administrator|
|Deposited On:||26 Mar 2008|
|Last Modified:||26 Dec 2012 09:54|
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