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Hauenstein, R. J. and Schlesinger, T. E. and McGill, T. C. et al. (1986) Summary Abstract: Schottky barrier height measurements of type A and type B NiSi2 on Si. Journal of Vacuum Science and Technology B, 4 (2). pp. 549-550. ISSN 1071-1023. http://resolver.caltech.edu/CaltechAUTHORS:HAUjvstb86