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Wong, Selmer S. and He, Gang and Nikzad, Shouleh et al. (1995) Local order measurement in SnGe alloys and monolayer Sn films on Si with reflection electron energy loss spectrometry. Journal of the Vacuum Society of America A, 13 (2). pp. 216-220. ISSN 0734-2101. http://resolver.caltech.edu/CaltechAUTHORS:WONjvsta95