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Hoh, Jan H. and Revel, Jean-Paul and Hansma, Paul K. (1991) Tip-sample interactions in atomic force microscopy: I. Modulating adhesion between silicon nitride and glass. Nanotechnology, 2 (3). pp. 119-122. ISSN 0957-4484. http://resolver.caltech.edu/CaltechAUTHORS:HOHnanotech91

This list was generated on Wed Jun 28 00:22:29 2017 PDT.