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Xu, Ke and Cao, Peigen and Heath, James R. (2009) Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers. Nano Letters, 9 (12). pp. 4446-4451. ISSN 1530-6984. http://resolver.caltech.edu/CaltechAUTHORS:20091223-134117061

This list was generated on Fri Apr 28 07:12:02 2017 PDT.