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Bridger, P. M. and Bandić, Z. Z. and Piquette, E. C. et al. (1999) Electric force microscopy of induced charges and surface potentials in GaN modified by light and strain. Journal of Vacuum Science and Technology B, 17 (4). pp. 1750-1752. ISSN 1071-1023. http://resolver.caltech.edu/CaltechAUTHORS:BRIjvstb99

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