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Xu, Ke and Cao, Peigen and Heath, James R. (2010) Achieving the Theoretical Depairing Current Limit in Superconducting Nanomesh Films. Nano Letters, 10 (10). pp. 4206-4210. ISSN 1530-6984. http://resolver.caltech.edu/CaltechAUTHORS:20101102-073526881

This list was generated on Wed Jun 28 22:26:16 2017 PDT.