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Wang, M. W. and Swenberg, J. F. and Phillips, M. C. et al. (1994) X-ray photoelectron spectroscopy measurement of valence-band offsets for Mg-based semiconductor compounds. Applied Physics Letters, 64 (25). pp. 3455-3457. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:WANapl94

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