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Brown, Michal A. and Park, Tae-Soon and Rosakis, A. J. et al. (2006) A Comparison of X-Ray Microdiffraction and Coherent Gradient Sensing in Measuring Discontinuous Curvatures in Thin Film: Substrate Systems. Journal of Applied Mechanics, 73 (5). pp. 723-729. ISSN 0021-8936. http://resolver.caltech.edu/CaltechAUTHORS:20110128-152248446