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Boyd, D. A. and El-Naggar, M. Y. and Goodwin, D. G. (2006) In situ measurements of stress with temperature in thin film Pb_xBa_(1-x)TiO_3. Integrated Ferroelectrics, 83 (1). pp. 155-164. ISSN 1058-4587. http://resolver.caltech.edu/CaltechAUTHORS:20110217-105906732

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