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Kosten, Emily D. and Warren, Emily L. and Atwater, Harry A. (2011) Ray optical light trapping in silicon microwires: exceeding the 2n^2 intensity limit. Optics Express, 19 (4). pp. 3316-3331. ISSN 1094-4087. http://resolver.caltech.edu/CaltechAUTHORS:20110415-155438432

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