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Bridger, P. M. and Bandić, Z. Z. and Piquette, E. C. et al. (1999) Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy. Applied Physics Letters, 74 (23). pp. 3522-3524. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:BRIapl99