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Bachman, C. H. and Ramo, Simon (1943) Electrostatic Electron Microscopy. II. Journal of Applied Physics, 14 (2). pp. 69-77. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:BACjap43b

This list was generated on Mon Jun 26 03:40:53 2017 PDT.