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Vendroux, G. and Knauss, W. G. (1994) Deformation Measurements at the Sub-Micron Size Scale: II. Refinements in the Algorithm for Digital Image Correction. California Institute of Technology , Pasadena, CA. (Unpublished) http://resolver.caltech.edu/CaltechGALCITSM:GALCITSM94-5

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