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Grindlay, J. and Bildsten, L. and Chakrabarty, D. et al. (2000) EXIST: A high sensitivity hard x-ray imaging sky survey mission for ISS. In: Fifth Compton Symposium. AIP Conference Proceedings. No.510. American Institute of Physics , Melville, NY, pp. 784-788. ISBN 1-56396-932-7 http://resolver.caltech.edu/CaltechAUTHORS:20111122-162003558

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