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Buehler, Markus J. and van Duin, Adri C. T. and Goddard, William A., III (2006) Multiparadigm modeling of dynamical crack propagation in silicon using a reactive force field. Physical Review Letters, 96 (9). Art. No. 095505. ISSN 0031-9007. http://resolver.caltech.edu/CaltechAUTHORS:BUEprl06

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