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Kurtin, Stephen and Shifrin, Gordon A. and McGill, T. C. (1969) Ion implantation damage of silicon as observed by optical reflection spectroscopy in the 1 to 6 eV region. Applied Physics Letters, 14 (7). pp. 223-225. ISSN 0003-6951. http://resolver.caltech.edu/CaltechAUTHORS:KURapl69

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