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Zhang, Z. and Roukes, M. L. and Hammel, P. C. (1996) Sensitivity and spatial resolution for electron-spin-resonance detection by magnetic resonance force microscopy. Journal of Applied Physics, 80 (12). pp. 6931-6938. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:ZHAjap96

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