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Wie, Chu Ryang and Tombrello, T. A. and Vreeland, T., Jr. (1986) MeV ion damage in GaAs single crystals: Strain saturation and role of nuclear and electronic collisions in defect production. Physical Review B, 33 (6). pp. 4083-4089. ISSN 0163-1829. http://resolver.caltech.edu/CaltechAUTHORS:WIEprb86