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Feng, Tao and Miller, Gerald and Atwater, Harry A. (2007) Charge retention characteristics of silicon nanocrystal layers by ultrahigh vacuum atomic force microscopy. Journal of Applied Physics, 102 (3). Art. No. 034305. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:FENjap07

This list was generated on Mon Jun 26 10:35:10 2017 PDT.