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Feng, Tao and Miller, Gerald and Atwater, Harry A. (2007) Charge retention characteristics of silicon nanocrystal layers by ultrahigh vacuum atomic force microscopy. Journal of Applied Physics, 102 (3). Art. No. 034305. ISSN 0021-8979. http://resolver.caltech.edu/CaltechAUTHORS:FENjap07

This list was generated on Wed Mar 22 15:12:57 2017 PDT.