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Baum, Peter and Zewail, Ahmed H. (2006) Breaking resolution limits in ultrafast electron diffraction and microscopy. Proceedings of the National Academy of Sciences of the United States of America, 103 (44). pp. 16105-16110. ISSN 0027-8424. PMCID PMC1637544.

This list was generated on Tue Jun 27 10:40:03 2017 PDT.