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Chason, E. and Tsao, J. Y. and Horn, K. M. et al. (1990) Surface roughening of Ge(001) during 200 eV Xe ion bombardment and Ge molecular beam epitaxy. Journal of Vacuum Science and Technology A, 8 (3). pp. 2507-2511. ISSN 0734-2101. http://resolver.caltech.edu/CaltechAUTHORS:CHAjvsta90