Number of items: 7.
L
Liau, Z. L. and Tsaur, B. Y. and Mayer, J. W.
(1979)
Influence of atomic mixing and preferential sputtering on depth profiles and interfaces.
Journal of Vacuum Science and Technology, 16
(2).
pp. 121-127.
ISSN 0022-5355
http://resolver.caltech.edu/CaltechAUTHORS:20120726-092329135
Liau, Z. L. and Mayer, J. W.
(1978)
Limits of composition achievable by ion implantation.
Journal of Vacuum Science and Technology, 15
(5).
pp. 1629-1635.
ISSN 0022-5355
http://resolver.caltech.edu/CaltechAUTHORS:20120802-072906574
Lau, S. S.
et al.
(1977)
Heterostructure by solid‐phase epitaxy in the Si〈111〉/Pd/Si (amorphous) system.
Journal of Applied Physics, 48
(3).
pp. 917-919.
ISSN 0021-8979
http://resolver.caltech.edu/CaltechAUTHORS:20120808-085747179
Lau, S. S.
et al.
(1976)
Antimony doping of Si layers grown by solid-phase epitaxy.
Applied Physics Letters, 28
(3).
pp. 148-150.
ISSN 0003-6951
http://resolver.caltech.edu/CaltechAUTHORS:LAUapl76
P
Pretorius, R.
et al.
(1977)
Growth mechanism for solid-phase epitaxy of Si in the Si <100>/Pd2Si/Si(amorphous) system studied by a radioactive tracer technique.
Journal of Applied Physics, 48
(7).
pp. 2886-2890.
ISSN 0021-8979
http://resolver.caltech.edu/CaltechAUTHORS:PREjap77
Pretorius, R.
et al.
(1976)
Dissociation mechanism for solid-phase epitaxy of silicon in the Si <100>/Pd2Si/Si (amorphous) system.
Applied Physics Letters, 29
(9).
pp. 598-600.
ISSN 0003-6951
http://resolver.caltech.edu/CaltechAUTHORS:PREapl76
T
Tsaur, B. Y.
et al.
(1979)
Depth dependence of atomic mixing by ion beams.
Applied Physics Letters, 35
(10).
pp. 825-828.
ISSN 0003-6951
http://resolver.caltech.edu/CaltechAUTHORS:TSAapl79
This list was generated on Fri May 24 01:58:02 2013 PDT.