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Items where Person is "Paine-B-N"

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Jump to: 1986

Number of items: 1.

1986

Vreeland, Thad, Jr. and Paine, Bruce M. (1986) X‐ray diffraction characterization of multilayer semiconductor structures. Journal of Vacuum Science and Technology A, 4 (6). pp. 3153-3159. ISSN 0734-2101 http://resolver.caltech.edu/CaltechAUTHORS:20120627-095239074

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