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Adams, P. M. and Bowman, R. C., Jr. and Ahn, C. C. and Chang, S. J. and Arbet-Engels, V. and Kallel, M. A. and Wang, K. L. (1992) Structural characterization of Si(m)Ge(n) strained layer superlattices. Journal of Applied Physics, 71 (9). pp. 4305-4313. ISSN 0021-8979 http://resolver.caltech.edu/CaltechAUTHORS:ADAjap92

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