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Transmission Electron Microscopy and Diffractometry of Materials (Fourth Edition)

Fultz, Brent and Howe, James (2013) Transmission Electron Microscopy and Diffractometry of Materials (Fourth Edition). Graduate Texts in Physics. Springer , Berlin. ISBN 978-3-642-29760-1.

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This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Item Type:Book
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Fultz, Brent0000-0002-6364-8782
Additional Information:© 2013 Springer-Verlag Berlin Heidelberg.
Subject Keywords:Characterization of Materials; Dark-Field and Bright-Field Imaging; Diffraction and Imaging; Diffraction from Crystals; Imaging Lens Systems; Neutron Scattering; Small-Angle Scattering; Theory of Electron Microscopy and X-Ray Diffraction; Transmission Electron Microscopy; X-Ray Diffractometry
Series Name:Graduate Texts in Physics
Record Number:CaltechAUTHORS:20200203-133756433
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:101078
Deposited By: Tony Diaz
Deposited On:03 Feb 2020 21:47
Last Modified:16 Nov 2021 17:59

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