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Current and Temperature Thresholds for Short-Term Oxygen Poisoning of Hollow Cathodes

Capece, Angela M. and Polk, James E. and Shepherd, Joseph E. (2008) Current and Temperature Thresholds for Short-Term Oxygen Poisoning of Hollow Cathodes. In: 44th AIAA/ASME/SAE/ASEE Joint Propulsion Conference & Exhibit. American Institute of Aeronautics and Astronautics , Reston, VA. ISBN 978-1-60086-992-1. https://resolver.caltech.edu/CaltechAUTHORS:20200310-143411569

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Abstract

Hollow cathodes that operate with impurities in the xenon propellant exhibit poisoning of the emitter surface, resulting in a higher surface work function and increased operating temperatures. The goal of this paper is to provide insight Into the physical processes responsible for cathode degradation during short-duration oxygen poisoning over a range of discharge currents and surface temperatures. The experimental results presented here show that the cathode is more susceptible to poisoning at higher oxygen concentration levels, lower discharge currents, and lower initial insert temperatures. The threshold current at which the emitter surface becomes susceptible to oxygen poisoning was determined to be between 8.24 A and 10.17 A for an oxygen concentration level of 10 ppm, and between 10.17 A and 12.35 A for oxygen concentration levels of 50 and 100 ppm. To determine the threshold surface temperature, further work must be conducted to isolate the effects of xenon ion sputtering and surface temperature on cathode operation during poisoning.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.2514/6.2008-4813DOIArticle
ORCID:
AuthorORCID
Shepherd, Joseph E.0000-0003-3181-9310
Additional Information:© 2008 by the American Institute of Aeronautics and Astronautics, Inc. The U.S. Government has a royalty-free license to exercise all rights under the copyright claimed herein for Governmental purposes. All other rights are reserved by the copyright owner. Published Online: 15 Jun 2012.
Group:GALCIT
Record Number:CaltechAUTHORS:20200310-143411569
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20200310-143411569
Official Citation:Current and Temperature Thresholds for Short-Term Oxygen Poisoning of Hollow Cathodes. Angela Capece, James Polk, and Joseph Shepherd. 44th AIAA/ASME/SAE/ASEE Joint Propulsion Conference & Exhibit. July 2008; doi: 10.2514/6.2008-4813
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:101836
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:10 Mar 2020 21:47
Last Modified:24 Mar 2020 16:02

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