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High-Throughput Measurement of Ionic Conductivity in Composition-Spread Thin Films

Duan, H. and Yuan, C. C. and Becerra, N. and Small, L. J. and Chang, A. and Gregoire, J. M. and van Dover, R. B. (2013) High-Throughput Measurement of Ionic Conductivity in Composition-Spread Thin Films. ACS Combinatorial Science, 15 (6). pp. 273-277. ISSN 2156-8952. doi:10.1021/co4000375. https://resolver.caltech.edu/CaltechAUTHORS:20200407-130730098

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Abstract

This paper demonstrates the feasibility of high-throughput investigation of ionic conductivity in oxygen-ion conductors. Yttria stabilized zirconia (YSZ) composition-spread thin films with nanometer-size grains were prepared by 90° off-axis reactive RF cosputtering. We compare results for two electrode configurations, namely, out-of-plane (parallel plate) and in-plane (planar interdigitated electrode) and find that the contribution from the intragrain conductivity in YSZ thin films (150 nm) is more explicit in the latter configuration because it greatly diminishes electrode effects. The intragrain oxygen ion conductivity of thin film YSZ was systematically measured as a function of yttria concentration over the range 2 mol % to 12 mol %. The results show that the measured conductivity of the YSZ thin films is close to that of corresponding bulk materials with a peak value around 3 × 10⁻⁴ S cm⁻¹ at 440 °C at the optimum Y₂O₃ concentration of 8 mol %. Validation of this technique means that it can be applied to novel chemical systems for which systematic bulk measurements have not been attempted.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1021/co4000375DOIArticle
ORCID:
AuthorORCID
Gregoire, J. M.0000-0002-2863-5265
Additional Information:© 2013 American Chemical Society. Received: June 19, 2012; Published: May 5, 2013. This work utilized XRD and TEM facilities of the Cornell Center for Materials Research (NSF Funding: DMR-0520404), and was performed in part at the Cornell NanoScale Facility, a member of the National Nanotechnology Infrastructure Network, which is supported by the National Science Foundation (Grant ECS-0335765). This research was supported by the U.S. Department of Energy (DOE) Office of Basic Energy Sciences under Award Number DE-FG02–07ER46440. The authors declare no competing financial interest.
Funders:
Funding AgencyGrant Number
NSFDMR-0520404
NSFECS-0335765
Department of Energy (DOE)DE-FG02–07ER46440
Subject Keywords:yttria-stabilized zirconia thin films, composition-spread, cosputtering, ionic conductivity
Issue or Number:6
DOI:10.1021/co4000375
Record Number:CaltechAUTHORS:20200407-130730098
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20200407-130730098
Official Citation:High-Throughput Measurement of Ionic Conductivity in Composition-Spread Thin Films. H. Duan, C. C. Yuan, N. Becerra, L. J. Small, A. Chang, J. M. Gregoire, and R. B. van Dover. ACS Combinatorial Science 2013 15 (6), 273-277; DOI: 10.1021/co4000375
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:102388
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:07 Apr 2020 20:17
Last Modified:16 Nov 2021 18:11

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