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High Throughput X-ray Diffraction Analysis of Combinatorial Polycrystalline Thin Film Libraries

Roncallo, Scilla and Karimi, Omeed and Rogers, Keith D. and Gregoire, John M. and Lane, David W. and Scragg, Jonathan J. and Ansari, Salman A. (2010) High Throughput X-ray Diffraction Analysis of Combinatorial Polycrystalline Thin Film Libraries. Analytical Chemistry, 82 (11). pp. 4564-4569. ISSN 0003-2700. https://resolver.caltech.edu/CaltechAUTHORS:20200407-134048387

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Abstract

With the increasing demand for new materials, analytical techniques which are able to rapidly characterize a large number of samples are becoming indispensable. Thin film technology has the potential to improve the amount of information contained on as-deposited samples by creating compositionally graded libraries. Conventionally, raster scan methods are used to interrogate such libraries but, in this paper, a different approach is presented to provide a method of high-throughput data collection and analysis using an X-ray diffraction (XRD) probe. An extended X-ray beam was used to illuminate the libraries, and a large area detector was used to collect the data. A new algorithm “Bandit” has been employed to analyze the collected data and extract the crystallographic information. The results of the technique have been compared with the raster scans showing that the algorithm provides reliable data at a significantly increased data acquisition speed.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1021/ac100572hDOIArticle
ORCID:
AuthorORCID
Gregoire, John M.0000-0002-2863-5265
Additional Information:© 2010 American Chemical Society. Received for review March 3, 2010. Accepted April 23, 2010. Publication Date: May 5, 2010. We acknowledge the EPSRC (EP/F029624/1 SUPERGEN Photovoltaic Materials for the 21st Century) and Royal Society of Chemistry (EP/D074665/1) for their financial assistance. We are also grateful to the Diamond Light Source for the provision of their facilities which enabled the collection of the diffraction data used within this study.
Funders:
Funding AgencyGrant Number
Engineering and Physical Sciences Research Council (EPSRC)EP/F029624/1
Engineering and Physical Sciences Research Council (EPSRC)EP/D074665/1
Royal Society of ChemistryUNSPECIFIED
Issue or Number:11
Record Number:CaltechAUTHORS:20200407-134048387
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20200407-134048387
Official Citation:High Throughput X-ray Diffraction Analysis of Combinatorial Polycrystalline Thin Film Libraries. Scilla Roncallo, Omeed Karimi, Keith D. Rogers, John M. Gregoire, David W. Lane, Jonathan J. Scragg, and Salman A. Ansari. Analytical Chemistry 2010 82 (11), 4564-4569; DOI: 10.1021/ac100572h
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:102393
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:07 Apr 2020 21:09
Last Modified:07 Apr 2020 21:09

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