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A General Relation Between Frequency Noise and Lineshape of Laser Light

Zhang, Zhewei and Yariv, Amnon (2020) A General Relation Between Frequency Noise and Lineshape of Laser Light. IEEE Journal of Quantum Electronics, 56 (3). Art. No. 1100105. ISSN 0018-9197. https://resolver.caltech.edu/CaltechAUTHORS:20200416-121413076

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Abstract

Lasers and especially semiconductor lasers (SCLs) are playing a major role in advanced technological and scientific tasks ranging from sensing, fundamental investigations in quantum optics and communications. The demand for ever-increasing accuracy and communication rates has driven these applications to employ phase modulation and coherent detection. The main laser attribute that comes into play is its coherence which is usually quantified by either the Schawlow-Townes (S-T) linewidth, the spectral width of the laser field, or the power spectral density (PSD) function of the laser frequency fluctuation. In this paper, we present a derivation of a general and direct relationship between these two coherence measures. We refer to the result as the Central Relation. The relation applies independently of the physical origin of the noise. Experiments are described which demonstrate the validity of the Central Relation and at the same time suggest new methods of controlling frequency noise at base band by optical filtering.


Item Type:Article
Related URLs:
URLURL TypeDescription
https://doi.org/10.1109/jqe.2020.2980011DOIArticle
ORCID:
AuthorORCID
Zhang, Zhewei0000-0002-1211-7957
Additional Information:© 2020 IEEE. This work is licensed under a Creative Commons Attribution 4.0 License. For more information, see https://creativecommons.org/licenses/by/4.0/. Manuscript received August 15, 2019; revised February 27, 2020; accepted March 3, 2020. Date of publication March 11, 2020; date of current version March 19, 2020.
Subject Keywords:Laser theory, laser noise, laser applications
Issue or Number:3
Record Number:CaltechAUTHORS:20200416-121413076
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20200416-121413076
Official Citation:Z. Zhang and A. Yariv, "A General Relation Between Frequency Noise and Lineshape of Laser Light," in IEEE Journal of Quantum Electronics, vol. 56, no. 3, pp. 1-5, June 2020, Art no. 1100105.
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:102575
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:16 Apr 2020 20:51
Last Modified:16 Apr 2020 20:51

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