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Measurement of Fast Rotation by VLSI Circuits

Born, Christof and Deutschmann, Rainer (1997) Measurement of Fast Rotation by VLSI Circuits. In: Mustererkennung 1997. Informatik aktuell. Springer , Berlin, pp. 517-524. ISBN 978-3-540-63426-3.

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There exist important problems that require the measurement of very fast motion. Common techniques for motion estimation based on sequences of video images usually fail to deliver the correct results for such problems due to the low video rate. We present an analog VLSI based system that determines motion in real-time. We demonstrate the performance of that system for the case of measuring the rotation speed of a fast rotating platform.

Item Type:Book Section
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Additional Information:© 1997 Springer-Verlag Berlin Heidelberg.
Series Name:Informatik aktuell
Record Number:CaltechAUTHORS:20200512-085235134
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:103128
Deposited By: Tony Diaz
Deposited On:12 May 2020 19:00
Last Modified:16 Nov 2021 18:18

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