CaltechAUTHORS
  A Caltech Library Service

Measurement of Fast Rotation by VLSI Circuits

Born, Christof and Deutschmann, Rainer (1997) Measurement of Fast Rotation by VLSI Circuits. In: Mustererkennung 1997. Informatik aktuell. Springer , Berlin, pp. 517-524. ISBN 978-3-540-63426-3. https://resolver.caltech.edu/CaltechAUTHORS:20200512-085235134

Full text is not posted in this repository. Consult Related URLs below.

Use this Persistent URL to link to this item: https://resolver.caltech.edu/CaltechAUTHORS:20200512-085235134

Abstract

There exist important problems that require the measurement of very fast motion. Common techniques for motion estimation based on sequences of video images usually fail to deliver the correct results for such problems due to the low video rate. We present an analog VLSI based system that determines motion in real-time. We demonstrate the performance of that system for the case of measuring the rotation speed of a fast rotating platform.


Item Type:Book Section
Related URLs:
URLURL TypeDescription
https://doi.org/10.1007/978-3-642-60893-3_56DOIArticle
Additional Information:© 1997 Springer-Verlag Berlin Heidelberg.
Series Name:Informatik aktuell
Record Number:CaltechAUTHORS:20200512-085235134
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:20200512-085235134
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:103128
Collection:CaltechAUTHORS
Deposited By: Tony Diaz
Deposited On:12 May 2020 19:00
Last Modified:12 May 2020 19:00

Repository Staff Only: item control page