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Tropical Forest Height and Underlying Topography from Tandem-X SAR Interferometry

Lei, Yang and Treuhaft, Robert and Gonçalves, Fabio (2020) Tropical Forest Height and Underlying Topography from Tandem-X SAR Interferometry. In: 2020 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2020). IEEE , Piscataway, NJ, pp. 4979-4982. ISBN 9781728163741.

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Spaceborne SAR Interferometry (InSAR) has the sensitivity to measure canopy height as well as the underlying topography. However, these measurements are limited by attenuation of the radar wave. In this paper, we refine an interferometric approach that exploits few-look averaged interferograms, a coherent electromagnetic simulator and field inventory data. Both the underlying topography as well as the canopy height (forest mean height, canopy top height) are estimated through a statistical method that relates the true ground position to the statistics of few-look InSAR phase-heights that are simulated using the simulator and field data. Using DLR's TanDEM-X InSAR data, we validate the approach over a well-studied Brazilian tropical forest with both field inventory and lidar data. As validated against lidar data, the estimated underlying topography has an accuracy of 3 m, while the forest mean height and canopy top height have an accuracy of 3 m and 4–5 m, respectively, at the resolution of one hectare forest stands. Given the global data availability of TanDEM-X and the future TanDEM-L, this approach has the potential of wall-to-wall mapping of the forest height as well as underlying topography using single polarization/baseline.

Item Type:Book Section
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Lei, Yang0000-0002-8377-1980
Additional Information:© 2020 IEEE.
Subject Keywords:Spaceborne, synthetic aperture radar interferometry, InSAR, forest height, underlying topography, lidar, DEM, DTM, TanDEM-X, SRTM, Tapajós National Forest, tropical
Record Number:CaltechAUTHORS:20210225-115746599
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Official Citation:Y. Lei, R. Treuhaft and F. Gonçalves, "Tropical Forest Height and Underlying Topography from Tandem-X SAR Interferometry," IGARSS 2020 - 2020 IEEE International Geoscience and Remote Sensing Symposium, Waikoloa, HI, USA, 2020, pp. 4979-4982, doi: 10.1109/IGARSS39084.2020.9324576
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:108197
Deposited By: Tony Diaz
Deposited On:25 Feb 2021 21:05
Last Modified:16 Nov 2021 19:09

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