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Proof of Concept for Through Silicon Vias (TSVs) in Application Specific Integrated Circuits (ASICs) for Hard X-ray Imaging Detectors

Hong, Jaesub and Grindlay, Jonathan and Allen, Branden and Violette, Daniel P. and Miyasaka, Hiromasa and Malta, Dean and Ovental, Jennifer and Bordelon, David and Richter, Daniel (2021) Proof of Concept for Through Silicon Vias (TSVs) in Application Specific Integrated Circuits (ASICs) for Hard X-ray Imaging Detectors. . (Submitted)

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Application Specific Integrated Circuits (ASICs) are commonly used to efficiently process the signals from sensors and detectors in space. Wire bonding is a space qualified technique of making interconnections between ASICs and their substrate packaging board for power, control and readout of the ASICs. Wire bonding is nearly ubiquitous in modern space programs, but their exposed wires can be prone to damage during assembly and subject to electric interference during operations. Additional space around the ASICs needed for wire bonding also impedes efficient packaging of large arrays of detectors. Here we introduce the Through Silicon Vias (TSV) technology that replaces wire bonds and eliminates their shortcomings. We have successfully demonstrated the feasibility of implementing TSVs to existing ASIC wafers (a.k.a. a via-last process) developed for processing the X-ray signals from the X-ray imaging CdZnTe detectors on the Nuclear Spectroscopic Telescope Array (NuSTAR) Small Explorer mission that was launched in 2012. While TSVs are common in the semiconductor industry, this is the first (to our knowledge) successful application for Astrophysics imaging instrumentation. We expect that the TSV technology will simplify the detector assembly, and thus will enable significant cost and schedule savings in assembly of large area CdZnTe detectors.

Item Type:Report or Paper (Discussion Paper)
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URLURL TypeDescription Paper
Grindlay, Jonathan0000-0002-1323-5314
Miyasaka, Hiromasa0000-0002-8074-4186
Additional Information:Attribution 4.0 International (CC BY 4.0). This work was supported by NASA APRA grant NNX17AE62G.
Group:Space Radiation Laboratory
Funding AgencyGrant Number
Subject Keywords:ASIC, X-ray, CdZnTe detectors, Wire bond, Through Silicon Vias
Record Number:CaltechAUTHORS:20210318-162735516
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:108496
Deposited By: Tony Diaz
Deposited On:24 Mar 2021 21:39
Last Modified:24 Mar 2021 21:39

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