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Element-specific electronic and structural dynamics using transient XUV and soft X-ray spectroscopy

Liu, Hanzhe and Klein, Isabel M. and Michelsen, Jonathan M. and Cushing, Scott K. (2021) Element-specific electronic and structural dynamics using transient XUV and soft X-ray spectroscopy. Chem, 7 (10). pp. 2569-2584. ISSN 2451-9294. doi:10.1016/j.chempr.2021.09.005.

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Transient extreme ultraviolet (XUV) and soft X-ray absorption techniques can measure element-specific ultrafast carrier and structural dynamics in materials or multilayer junctions. However, interpretation of the excited-state spectra is not straightforward. The core-hole couples with valence states, distorting the measured spectra. In this perspective, we describe the implementation and interpretation of XUV experiments. This description includes a guide for how to design a transient XUV/soft X-ray spectroscopy experiment by choosing a suitable edge and corresponding X-ray sources. We particularly focus on the rising use of XUV spectroscopy for understanding solar energy materials, such as measurements of polaron formation, electron and hole kinetics, and layer-resolved charge transport in junctions. The ability to measure photoexcited carriers in each layer of a multilayer junction, as well as associated reaction products, could prove particularly impactful in the study of molecules, materials, and their combinations that lead to functional devices in photochemistry and photoelectrochemistry.

Item Type:Article
Related URLs:
URLURL TypeDescription Paper
Liu, Hanzhe0000-0001-9001-725X
Cushing, Scott K.0000-0003-3538-2259
Alternate Title:Element-specific electronic and structural dynamics using transient X-ray spectroscopy
Additional Information:© 2021 Elsevier Inc. Available online 14 October 2021. This material is based upon work supported by the US Air Force Office of Scientific Research under award number FA9550-21-1-0022 and by the US Department of Energy, Office of Science, Office of Basic Energy Sciences, Fuels from Sunlight Hub under award number DE-SC0021266. I.M.K. was supported by the US National Science Foundation Graduate Research Fellowship Program under grant no. 1745301. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. The authors declare no competing interests.
Funding AgencyGrant Number
Air Force Office of Scientific Research (AFOSR)FA9550-21-1-0022
Department of Energy (DOE)DE-SC0021266
NSF Graduate Research FellowshipDGE-1745301
Subject Keywords:transient XUV/X-ray spectroscopy; renewable energy; spectroscopy; physical chemistry; material science
Issue or Number:10
Record Number:CaltechAUTHORS:20210713-215644790
Persistent URL:
Official Citation:Hanzhe Liu, Isabel M. Klein, Jonathan M. Michelsen, Scott K. Cushing, Element-specific electronic and structural dynamics using transient XUV and soft X-ray spectroscopy, Chem, Volume 7, Issue 10, 2021, Pages 2569-2584, ISSN 2451-9294,
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:109796
Deposited By: Tony Diaz
Deposited On:13 Jul 2021 22:03
Last Modified:26 Oct 2021 16:24

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