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Scanned-cantilever atomic force microscope

Baselt, David R. and Baldeschwieler, John D. (1993) Scanned-cantilever atomic force microscope. Review of Scientific Instruments, 64 (4). pp. 908-911. ISSN 0034-6748.

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We have developed a 3.6 µm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilever. The performance of the microscope matches that of scanned-sample instruments.

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Additional Information:Copyright © 1993 American Institute of Physics. Received 28 September 1992; accepted 11 December 1992. We would like to thank Jean-Paul Revel for suggesting that we image collagen fibrils and for help preparing collagen samples. We would also like to thank Shubert Soares for the polished quartz samples and Topometrix, Inc. for the use of their electronics. This work was supported in part by a grant from the Ford Motor Company and an NSF predoctoral fellowship (D.B.). David R. Baselt and John D. Baldeschwieler (1994) Comment on "Scanned-cantilever atomic force microscope" [Rev. Sci. Instrum. 64, 908 (1993)]. Rev. Sci. Instrum. 65, 2160 (1994). DOI:10.1063/1.1144721
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Ford Motor CompanyUNSPECIFIED
National Science Foundation predoctoral fellowshipUNSPECIFIED
Issue or Number:4
Record Number:CaltechAUTHORS:BASrsi93a
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ID Code:11132
Deposited By: Archive Administrator
Deposited On:17 Jul 2008 16:27
Last Modified:03 Oct 2019 00:16

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