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The reliability of single-error protected computer memories

Blaum, Mario and Goodman, Rodney and McEliece, Robert (1988) The reliability of single-error protected computer memories. IEEE Transactions on Computers, 37 (1). pp. 114-119. ISSN 0018-9340. doi:10.1109/12.75143.

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The lifetimes of computer memories which are protected with single-error-correcting-double-error-detecting (SEC-DED) codes are studies. The authors assume that there are five possible types of memory chip failure (single-cell, row, column, row-column and whole chip), and, after making a simplifying assumption (the Poisson assumption), have substantiated that experimentally. A simple closed-form expression is derived for the system reliability function. Using this formula and chip reliability data taken from published tables, it is possible to compute the mean time to failure for realistic memory systems.

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Additional Information:© 1988 IEEE. Reprinted with permission. Manuscript received June 5, 1984; revised June 10, 1985. R. Goodman was supported by Caltech’s Program in Advanced Technologies, sponsored by Aerojet General, General Motors, GTE, and TRW. R. McEliece was supported by a grant from IBM.
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Caltech’s Program in Advanced TechnologiesUNSPECIFIED
Aerojet GeneralUNSPECIFIED
Subject Keywords:Error-correcting codes, RAM’S, reliability, SEC-DED codes, semiconductor memory systems
Issue or Number:1
Record Number:CaltechAUTHORS:BLAieeetc88
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:11263
Deposited By: Archive Administrator
Deposited On:28 Jul 2008 23:00
Last Modified:08 Nov 2021 21:56

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