Vasquez, Richard P. and Brain, Ruth A. and Ross, David and Yeh, Nai-Chang (1992) Epitaxial C₆₀ Film on Si(111) by XPS. Surface Science Spectra, 1 (2). pp. 242-245. ISSN 1055-5269. doi:10.1116/1.1247645. https://resolver.caltech.edu/CaltechAUTHORS:20220308-454058000
![[img]](https://authors.library.caltech.edu/style/images/fileicons/application_pdf.png) |
PDF
- Published Version
See Usage Policy. 592kB |
Use this Persistent URL to link to this item: https://resolver.caltech.edu/CaltechAUTHORS:20220308-454058000
Abstract
High resolution XPS measurements of the C 1s, including energy losses, and the valence band regions are presented for a high quality epitaxial film (average grain size ~70 nm) of C₆₀ on a Si (111) substrate. Similar films have also been characterized with x-ray diffraction and transmission electron microscopy.
| Item Type: | Article | ||||||
|---|---|---|---|---|---|---|---|
| Related URLs: |
| ||||||
| ORCID: |
| ||||||
| Alternate Title: | Epitaxial C60 Film on Si(111) by XPS | ||||||
| Additional Information: | © 1992 American Vacuum Society. This work was supported by a grant from the Caltech President's Fund. | ||||||
| Funders: |
| ||||||
| Subject Keywords: | photoemission; fullerene | ||||||
| Issue or Number: | 2 | ||||||
| Classification Code: | PACS: 79.60.Eq, 68.55.Jk | ||||||
| DOI: | 10.1116/1.1247645 | ||||||
| Record Number: | CaltechAUTHORS:20220308-454058000 | ||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:20220308-454058000 | ||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | ||||||
| ID Code: | 113801 | ||||||
| Collection: | CaltechAUTHORS | ||||||
| Deposited By: | George Porter | ||||||
| Deposited On: | 09 Mar 2022 20:28 | ||||||
| Last Modified: | 09 Mar 2022 20:28 |
Repository Staff Only: item control page
