Cui, Xiquan and Lew, Matthew and Yang, Changhuei (2008) Quantitative differential interference contrast microscopy based on structured-aperture interference. Applied Physics Letters, 93 (9). Art. No. 091113. ISSN 0003-6951. https://resolver.caltech.edu/CaltechAUTHORS:CUIapl08
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Abstract
We report a quantitative differential interference contrast (DIC) microscope based on a structured-aperture (SA) wavefront sensor. Unlike a conventional DIC microscope, the SA-DIC microscope can separate the amplitude and the phase gradient information of the image wavefront, and form quantitative intensity and DIC images of the sample with good resolution; our prototype achieved resolution ~2 µm. Furthermore, due to the nonpolarization nature of the microscope, we were able to image birefringent samples without artifacts.
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| Additional Information: | © 2008 American Institute of Physics. Received 21 May 2008; accepted 11 August 2008; published 4 September 2008. The authors acknowledge financial support from the Defense Advanced Research Projects Agency Center for Optofluidic Integration. We thank Professor Paul Sternberg, Dr. Ying Zhou, Jigang Wu, Guoan Zheng, and Emily McDowell for their technical assistance and enlightening discussions. | |||||||||
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| Subject Keywords: | image resolution, image sensors, optical microscopy, wavefront sensors | |||||||||
| Issue or Number: | 9 | |||||||||
| Record Number: | CaltechAUTHORS:CUIapl08 | |||||||||
| Persistent URL: | https://resolver.caltech.edu/CaltechAUTHORS:CUIapl08 | |||||||||
| Usage Policy: | No commercial reproduction, distribution, display or performance rights in this work are provided. | |||||||||
| ID Code: | 11586 | |||||||||
| Collection: | CaltechAUTHORS | |||||||||
| Deposited By: | Archive Administrator | |||||||||
| Deposited On: | 08 Sep 2008 21:58 | |||||||||
| Last Modified: | 09 Mar 2020 13:19 |
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