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Nanopencil as a wear-tolerant probe for ultrahigh density data storage

Tayebi, Noureddine and Narui, Yoshie and Chen, Robert J. and Collier, C. Patrick and Giapis, Konstantinos P. and Zhang, Yuegang (2008) Nanopencil as a wear-tolerant probe for ultrahigh density data storage. Applied Physics Letters, 93 (10). Art. No. 103112. ISSN 0003-6951. https://resolver.caltech.edu/CaltechAUTHORS:TAYapl08

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Abstract

A dielectric-sheathed carbon nanotube probe, resembling a “nanopencil,” has been fabricated by conformal deposition of silicon-oxide on a carbon nanotube and subsequent “sharpening” to expose its tip. The high aspect-ratio nanopencil probe takes advantage of the small nanotube electrode size, while avoiding bending and buckling issues encountered with naked or polymer-coated carbon nanotube probes. Since the effective electrode diameter of the probe would not change even after significant wear, it is capable of long-lasting read/write operations in contact mode with a bit size of several nanometers.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1063/1.2981641DOIArticle
http://link.aip.org/link/?APPLAB/93/103112/1PublisherArticle
ORCID:
AuthorORCID
Giapis, Konstantinos P.0000-0002-7393-298X
Additional Information:© 2008 American Institute of Physics. Received 17 July 2008; accepted 19 August 2008; published 11 September 2008.
Subject Keywords:carbon nanotubes, dielectric thin films, electrodes, nanotechnology, random-access storage, silicon compounds, wear resistance
Issue or Number:10
Record Number:CaltechAUTHORS:TAYapl08
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:TAYapl08
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:11626
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:14 Sep 2008 00:16
Last Modified:03 Oct 2019 00:20

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