Element-specific electronic and structural dynamics using transient X-ray spectroscopy

Abstract

Transient X-ray absorption techniques can measure ultrafast dynamics of the elemental edges in a material or multiple layer junction, giving them immense potential for deconvoluting concurrent processes. However, the interpretation of the photoexcited changes to an X-ray edge is not as simple as directly probing a transition with optical or infrared wavelengths. The core hole left by the core-level transition distorts the measured absorption and reflection spectra, both hiding and revealing different aspects of a photo-induced process. In this perspective, we describe the implementation and interpretation of transient X-ray experiments. This description includes a guide of how to choose the best wavelength and corresponding X-ray sources when designing an experiment. As an example, we focus on the rising use of extreme ultraviolet (XUV) spectroscopy for understanding performance limiting behaviors in solar energy materials, such as measurements of polaron formation, electron and hole kinetics, and charge transport in each layer of a metal-oxide-semiconductor junction. The ability of measuring photoexcited carriers in each layer of a multilayer junction could prove particularly impactful in the study of molecules, materials, and their combinations that lead to functional devices in photochemistry and photoelectrochemistry.