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Near-field scanning optical microscopy of photonic crystal nanocavities

Okamoto, Koichi and Lončar, Marko and Yoshie, Tomoyuki and Scherer, Axel and Qiu, Yueming and Gogna, Pawan (2003) Near-field scanning optical microscopy of photonic crystal nanocavities. Applied Physics Letters, 82 (11). pp. 1676-1678. ISSN 0003-6951. doi:10.1063/1.1559646.

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Near-field scanning optical microscopy was used to observe high-resolution images of confined modes and photonic bands of planar photonic crystal (PPC) nanocavities fabricated in active InGaAsP material. We have observed the smallest optical cavity modes, which are intentionally produced by fractional edge dislocation high-Q cavity designs. The size of the detected mode was roughly four by three lattice spacings. We have also observed extended dielectric-band modes of the bulk PPC surrounding the nanocavity by geometrically altering the bands in emission range and eliminating localized modes out of the emission range.

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Additional Information:©2003 American Institute of Physics. (Received 23 September 2002; accepted 20 January 2003) This work was supported by the Japan Society for the Promotion of Science (12002454), Caltech MURI Center for Quantum Networks, DARPA (MDA 972-00-1-0019), and AFOSR (F49620-01-6-0497). Two of the authors (Y.Q. and P.G.) acknowledge the partial support from the Cross Enterprise Technology Development Program at the Jet Propulsion Laboratory (under a contract with the National Aeronautics and Space Administration).
Subject Keywords:indium compounds; gallium arsenide; photonic crystals; microcavities; microcavity lasers; semiconductor quantum wells; quantum well lasers; near-field scanning optical microscopy; localised modes; photoluminescence; III-V semiconductors
Issue or Number:11
Record Number:CaltechAUTHORS:OKAapl03
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:1184
Deposited By: Archive Administrator
Deposited On:04 Jan 2006
Last Modified:08 Nov 2021 19:08

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