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Channeling measurements of lattice disorder at the GaAs–InAs(100) heterojunction

Williams, R. Stanley and Paine, B. M. and Schaffer, W. J. and Kowalczyk, S. P. (1982) Channeling measurements of lattice disorder at the GaAs–InAs(100) heterojunction. Journal of Vacuum Science and Technology, 21 (2). pp. 386-388. ISSN 0022-5355. doi:10.1116/1.571787. https://resolver.caltech.edu/CaltechAUTHORS:WILjvst82a

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Abstract

Rutherford backscattering spectrometry (RBS) combined with channeling techniques has been used to analyze the lattice disorder present in InAs thin films less than 1 µm thick grown on GaAs(100) substrates by molecular beam epitaxy (MBE). The axial channeling yields along [100], [110], and [111] reveal that roughly one quarter of the atoms in the thin films are out of registry with the InAs lattice at the heterojunction interface. The amount of lattice disorder decreases rapidly to undetectable (<1%) amounts at film thicknesses greater than 0.5 µm. The interface disorder arises as a result of the >7% lattice mismatch between GaAs and InAs.


Item Type:Article
Related URLs:
URLURL TypeDescription
http://dx.doi.org/10.1116/1.571787DOIUNSPECIFIED
Additional Information:© 1982 American Vacuum Society. Received 1 February 1982; accepted 12 April 1982. This work was supported in part by Wright-Patterson Air Force Aeronautical Laboratories under Contract No. F33615-80-C-1052. It was also supported in part by the Advanced Research Project Agency of the Department of Defense and monitored by the Air Force Office of Scientific Research under Contract No. F-49620-77-C-0087.
Funders:
Funding AgencyGrant Number
Wright-Patterson Air Force Aeronautical LaboratoriesF33615-80-C-1052
Defense Advanced Research Projects AgencyUNSPECIFIED
Air Force Office of Scientific ResearchF-49620-77-C-0087
Subject Keywords:HETEROJUNCTIONS, GALLIUM ARSENIDES, INDIUM, EPITAXY, BACKSCATTERING, THIN FILMS, LATTICE PARAMETERS, RUTHERFORD SCATTERING, ION CHANNELING, HELIUM IONS, MEV RANGE 01–10, CRYSTAL DEFECTS
Issue or Number:2
DOI:10.1116/1.571787
Record Number:CaltechAUTHORS:WILjvst82a
Persistent URL:https://resolver.caltech.edu/CaltechAUTHORS:WILjvst82a
Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:11924
Collection:CaltechAUTHORS
Deposited By: Archive Administrator
Deposited On:09 Oct 2008 23:29
Last Modified:08 Nov 2021 22:23

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