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Tip-sample interactions in atomic force microscopy: I. Modulating adhesion between silicon nitride and glass

Hoh, Jan H. and Revel, Jean-Paul and Hansma, Paul K. (1991) Tip-sample interactions in atomic force microscopy: I. Modulating adhesion between silicon nitride and glass. Nanotechnology, 2 (3). pp. 119-122. ISSN 0957-4484. doi:10.1088/0957-4484/2/3/003.

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An adhesive interaction between a silicon nitride AFM tip and glass substrate in water is described. This adhesion is in the range 5-40 nN, of which a large component is likely to be due to hydrogen bonding between the silanol groups on both surfaces. The interaction can be modulated by a variety of buffers commonly used in biochemical and biological research, including sodium phosphate, tris(hydroxymethyl)aminomethane, glycine, and N-2-hydroxyethyl-piperazine N'-2-ethanesulfonic acid. Using these buffers it appears that there are effects of ion concentration, ion type and pH on the measured adhesion. Of the conditions examined, phosphate was most effective at reducing adhesion and could be used at concentrations as low as 10 mM at neutral pH. The results demonstrate that the chemical interactions between tip and sample can be modulated, and provide a basis for designing conditions for imaging and manipulating biological molecules and structures.

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Additional Information:Copyright © Institute of Physics and IOP Publishing Limited 1991. Received 9 November 1991, accepted for publication 16 March 1992. This research was supported by the Office of Naval Research (PKH) and fellowships from the Colvin and Merck funds (JHH).
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Office of Naval ResearchUNSPECIFIED
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Record Number:CaltechAUTHORS:HOHnanotech91
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Usage Policy:No commercial reproduction, distribution, display or performance rights in this work are provided.
ID Code:12599
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Deposited On:15 Dec 2008 17:51
Last Modified:12 Jul 2022 19:42

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